White Paper

A New Framework: Opportunities of Open Access for Optimizing Yield in Semiconductor Manufacturing

As technology evolves and manufacturing processes become more complex, bad yield due to process variability and contamination is becoming a greater problem for the global semiconductor industry. Increasing yield and uptime will require deeper insights from more advanced and more efficient analytics. These can only come with unprecedented changes to the way the semiconductor industry approaches data and analytics.
Download our white paper to read insights from semiconductor industry leaders at Honeywell, Polar Semiconductor, and more—and learn how an industry-wide, open data monitoring and analytics platform could accelerate precision and yield optimization for the global semiconductor industry.